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This section includes 16 Mcqs, each offering curated multiple-choice questions to sharpen your Analytical Instrumentation knowledge and support exam preparation. Choose a topic below to get started.
| 1. |
Given below is the diagram of energy dispersive system. Identify the unmarked component. |
| A. | Lens |
| B. | Specimen |
| C. | Sample holder |
| D. | Energy analyser |
| Answer» C. Sample holder | |
| 2. |
Which of the following is the disadvantage of silicon semiconductor detector? |
| A. | Low stable |
| B. | Can be operated only at low temperatures |
| C. | Have low count-rate |
| D. | Low resolution |
| Answer» C. Have low count-rate | |
| 3. |
In curved crystal arrangement, angular velocity of the crystal is twice that of the detector. |
| A. | True |
| B. | False |
| Answer» C. | |
| 4. |
Which of the following can be done to avoid loss of intensities of X-rays due to the absorption of long wavelength X-rays? |
| A. | Apparatus must be contained in a chamber |
| B. | Air in the chamber must be replaced by helium |
| C. | Inert gas atmosphere must be provided |
| D. | Proper slits must be used |
| Answer» C. Inert gas atmosphere must be provided | |
| 5. |
The crystal used as X-ray grating has _______ dimensional lattice arrays. |
| A. | One |
| B. | Two |
| C. | Three |
| D. | Four |
| Answer» D. Four | |
| 6. |
WHICH_OF_THE_FOLLOWING_CAN_BE_DONE_TO_AVOID_LOSS_OF_INTENSITIES_OF_X-RAYS_DUE_TO_ABSORPTION_OF_LONG_WAVELENGTH_X-RAYS??$ |
| A. | Apparatus must be contained in a chamber |
| B. | Air in the chamber must be replaced by helium |
| C. | Inert gas atmosphere must be provided |
| D. | Proper slits must be used |
| Answer» C. Inert gas atmosphere must be provided | |
| 7. |
Which of the following is the disadvantage of silicon semiconductor detector?$ |
| A. | Low stable |
| B. | Can be operated only at low temperatures |
| C. | Have low count-rate |
| D. | Low resolution |
| Answer» C. Have low count-rate | |
| 8. |
In_curved_crystal_arrangement,_angular_velocity_of_the_crystal_is_twice_that_of_the_detector.$ |
| A. | True |
| B. | False |
| Answer» C. | |
| 9. |
The crystal used as X-ray grating has _______ dimensional lattice arrays? |
| A. | One |
| B. | Two |
| C. | Three |
| D. | Four |
| Answer» D. Four | |
| 10. |
The analysis of X-ray beam by diffraction is similar to spectrum analysis carried out with a diffraction grating. |
| A. | True |
| B. | False |
| Answer» B. False | |
| 11. |
In Energy dispersive system, the energy level and the number of pulses is related to which of the following? |
| A. | Amount of sample, element involved |
| B. | Element involved, concentration of the element |
| C. | Concentration of the element, element involved |
| D. | Number of atoms, amount of sample |
| Answer» C. Concentration of the element, element involved | |
| 12. |
Energy dispersive system uses which of the following detectors? |
| A. | Optical detector |
| B. | Semiconductor detector |
| C. | Thermistor |
| D. | Bolometer |
| Answer» C. Thermistor | |
| 13. |
Which of the following components make use of a thin metal foil to isolate a nearly mono-energetic excitation beam? |
| A. | Transmission-anode X-ray tube |
| B. | Secondary fluorescence target |
| C. | Slit |
| D. | Filters |
| Answer» E. | |
| 14. |
Which of the following does not make the X-ray tube nearly monochromatic? |
| A. | Transmission-anode X-ray tube |
| B. | Secondary fluorescence target |
| C. | Slit |
| D. | Filters |
| Answer» D. Filters | |
| 15. |
Why is a mono-energetic radiation source required in X-ray fluorescent spectrometer? |
| A. | To provide good sensitivity |
| B. | To provide high accuracy |
| C. | To provide a proper range |
| D. | To reduce unwanted background |
| Answer» E. | |
| 16. |
Which of the following components of the X-ray fluorescent spectrometer induces fluorescent radiation? |
| A. | Excitation source |
| B. | Energy analyser |
| C. | X-ray spectrometer |
| D. | Detection System |
| Answer» B. Energy analyser | |