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This section includes 20 Mcqs, each offering curated multiple-choice questions to sharpen your Analytical Instrumentation knowledge and support exam preparation. Choose a topic below to get started.
| 1. |
In powder diffractometer, the sharpness of the lines is greatly determined by which of the following? |
| A. | Quality of the sample, size of the slit |
| B. | Quality of the slit, size of the sample |
| C. | Thickness of the slit, amount of the sample |
| D. | Number of slits, composition of the sample |
| Answer» C. Thickness of the slit, amount of the sample | |
| 2. |
In Diffractometers, the intensities of the diffraction peaks of a given compound in a mixture are proportional to the fraction of the material in the mixture. |
| A. | True |
| B. | False |
| Answer» B. False | |
| 3. |
In Diffractometers, line intensities depend on ______ and kind of atomic reflection centres in each set of plates. |
| A. | Number |
| B. | Position |
| C. | Length |
| D. | Distance between lines |
| Answer» B. Position | |
| 4. |
Diffractometers are similar to which of the following? |
| A. | Optical grating spectrometer |
| B. | Prism spectrometer |
| C. | Photo multiplier |
| D. | Photovoltaic cell |
| Answer» B. Prism spectrometer | |
| 5. |
When certain geometric requirements are met, X-rays scattered from a crystalline solid can constructively interfere with each other and produce a diffracted beam. |
| A. | True |
| B. | False |
| Answer» B. False | |
| 6. |
In Diffractometer, the identification of a component of the sample from its powder diffraction pattern is based upon the _________ of lines and their relative ___________ |
| A. | Number, length |
| B. | Number, intensity |
| C. | Position, length |
| D. | Position, intensity |
| Answer» E. | |
| 7. |
With the help of which of the following equations is the distance calculated from a known wavelength of the source and measured angle? |
| A. | Coolidge equation |
| B. | Bragg’s equation |
| C. | Debye equation |
| D. | Scherrer equation |
| Answer» C. Debye equation | |
| 8. |
Using the powder method of diffractometers, which of the following can be determined? |
| A. | Percentage of K+ |
| B. | Percentage of Na+ and Cl- |
| C. | Percentage of KBr and NaCl |
| D. | Percentage of Br- |
| Answer» D. Percentage of Br- | |
| 9. |
DIFFRACTOMETERS_ARE_SIMILAR_TO_WHICH_OF_THE_FOLLOWING??$ |
| A. | Optical grating spectrometer |
| B. | Prism spectrometer |
| C. | Photo multiplier |
| D. | Photovoltaic cell |
| Answer» B. Prism spectrometer | |
| 10. |
In Diffractometers, the intensities of the diffraction peaks of a given compound in a mixture are proportional to the fraction of the material in the mixture.$ |
| A. | True |
| B. | False |
| Answer» B. False | |
| 11. |
In_Diffractometers,_line_intensities_depend_on________and_kind_of_atomic_reflection_centres_in_each_set_of_plates.$ |
| A. | Number |
| B. | Position |
| C. | Length |
| D. | Distance between lines |
| Answer» B. Position | |
| 12. |
In_powder_diffractometer,_the_sharpness_of_the_lines_is_greatly_determined_by_which_of_the_following? |
| A. | Quality of the sample, size of the slit |
| B. | Quality of the slit, size of the sample |
| C. | Thickness of the slit, amount of the sample |
| D. | Number of slits, composition of the sample |
| Answer» C. Thickness of the slit, amount of the sample | |
| 13. |
When certain geometric requirements are met, X-rays scattered from a crystalline solid can constructively interfere with each other and produce diffracted beam? |
| A. | True |
| B. | False |
| Answer» B. False | |
| 14. |
In Diffractometer, the identification of a component of the sample from its powder diffraction pattern is based upon the _________ of lines and their relative ___________. |
| A. | Number, length |
| B. | Number, intensity |
| C. | Position, length |
| D. | Position, intensity |
| Answer» E. | |
| 15. |
With the help of which of the following equations is the distance calculated from known wavelength of the source and measured angle? |
| A. | Coolidge equation |
| B. | Bragg’s equation |
| C. | Debye equation |
| D. | Scherrer equation |
| Answer» C. Debye equation | |
| 16. |
Which of the following is the most common instrument for photographic recording of diffraction patterns? |
| A. | Debye-Scherrer powder camera |
| B. | Gamma camera |
| C. | Geiger tube |
| D. | Scintillation counter |
| Answer» B. Gamma camera | |
| 17. |
In powder method, the powder sample is contained in which of the following? |
| A. | Thin walled glass capillary tubes |
| B. | Thin walled test tube |
| C. | Thin walled curvettes |
| D. | Thin walled flask |
| Answer» B. Thin walled test tube | |
| 18. |
Using powder method of diffractometers, which of the following can be determined? |
| A. | Percentage of K+ |
| B. | Percentage of Na+ and Cl- |
| C. | Percentage of KBr and NaCl |
| D. | Percentage of Br- |
| Answer» D. Percentage of Br- | |
| 19. |
X-ray diffractometers provide ____________ information about the compounds present in a solid sample. |
| A. | Quantitative |
| B. | Qualitative |
| C. | Quantitative and qualitative |
| D. | Either quantitative or qualitative |
| Answer» D. Either quantitative or qualitative | |
| 20. |
X-ray diffractometers are not used to identify the physical properties of which of the following? |
| A. | Metals |
| B. | Liquids |
| C. | Polymeric materials |
| D. | Solids |
| Answer» C. Polymeric materials | |