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This section includes 1267 Mcqs, each offering curated multiple-choice questions to sharpen your Embedded Systems knowledge and support exam preparation. Choose a topic below to get started.
| 1251. |
A process to determine how the actual testing is done _______ |
| A. | Audit |
| B. | Inspection |
| C. | Control |
| D. | Monitoring |
| Answer» B. Inspection | |
| 1252. |
In which type of test the capillary action principle is used? |
| A. | Probe test |
| B. | Bend liquid test |
| C. | Dye penetrant test |
| D. | Torsion test |
| Answer» D. Torsion test | |
| 1253. |
Which of the following is also known as boundary scan? |
| A. | test pattern |
| B. | JTAG |
| C. | FSM |
| D. | CRC |
| Answer» C. FSM | |
| 1254. |
Which of the following is a myth in testing? |
| A. | Tester can find bugs |
| B. | Any user can test software |
| C. | Missed defects are not due to testers |
| D. | Complete testing is not possible |
| Answer» C. Missed defects are not due to testers | |
| 1255. |
What is DfT? |
| A. | discrete Fourier transform |
| B. | discrete for transaction |
| C. | design for testability |
| D. | design Fourier transform |
| Answer» D. design Fourier transform | |
| 1256. |
SDLC stands for ________ |
| A. | Software development life cycle |
| B. | System development life cycle |
| C. | Software design life cycle |
| D. | System design life cycle |
| Answer» B. System development life cycle | |
| 1257. |
How is the quality of the test pattern evaluated? |
| A. | fault coverage |
| B. | test pattern |
| C. | size of the test pattern |
| D. | number of errors |
| Answer» B. test pattern | |
| 1258. |
Which of the following is a common testing conducted by the developers? |
| A. | Unit testing |
| B. | Entry testing |
| C. | Phrase testing |
| D. | Code testing |
| Answer» B. Entry testing | |
| 1259. |
In charpy test specimen, the angle of v-notch section is ___________ |
| A. | 30 degrees |
| B. | 45 degrees |
| C. | 60 degrees |
| D. | 90 degrees |
| Answer» C. 60 degrees | |
| 1260. |
Which is also called stuck-at model? |
| A. | byte pattern |
| B. | parity pattern |
| C. | bit pattern |
| D. | test pattern |
| Answer» E. | |
| 1261. |
Which of the following divides the input domain into classes containing data? |
| A. | Equivalent partitioning |
| B. | Environment partitioning |
| C. | Procedure division |
| D. | Compilation division |
| Answer» B. Environment partitioning | |
| 1262. |
The indenter used in Brinell hardness test is a ________________ |
| A. | Ball |
| B. | Cone |
| C. | Cylinder |
| D. | Pyramid |
| Answer» C. Cylinder | |
| 1263. |
Which of the following is based on fault models? |
| A. | alpha-numeric pattern |
| B. | test pattern |
| C. | bit pattern |
| D. | parity pattern |
| Answer» C. bit pattern | |
| 1264. |
Test cases ensure that all the statements are executed atleast once. |
| A. | True |
| B. | False |
| Answer» B. False | |
| 1265. |
During compression test of cast iron, the failure occurs i.e. the crack appears along the _________ |
| A. | Diagonal |
| B. | Surface parallel to load applied |
| C. | Surface perpendicular to load applied |
| D. | Lateral |
| Answer» B. Surface parallel to load applied | |
| 1266. |
Which is applied to a manufactured system? |
| A. | bit pattern |
| B. | parity pattern |
| C. | test pattern |
| D. | byte pattern |
| Answer» D. byte pattern | |
| 1267. |
Which of the following is a set of specially selected input patterns? |
| A. | test pattern |
| B. | debugger pattern |
| C. | bit pattern |
| D. | byte pattern |
| Answer» B. debugger pattern | |