MCQOPTIONS
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This section includes 14 Mcqs, each offering curated multiple-choice questions to sharpen your Analytical Instrumentation knowledge and support exam preparation. Choose a topic below to get started.
| 1. |
An accuracy of 1 part in 102 has been obtained in precision mass measurements. |
| A. | True |
| B. | False |
| Answer» C. | |
| 2. |
Nier-Johnson geometry involves a deflection of which of the following radians in a radial electrostatic field analyser? |
| A. | Π |
| B. | Π/2 |
| C. | Π/3 |
| D. | Π/4 |
| Answer» C. Π/3 | |
| 3. |
Which of the following is commonly varied in magnetic deflection mass spectrometer? |
| A. | Electric sector |
| B. | Magnetic fold strength |
| C. | Magnetic constant |
| D. | Electric constant |
| Answer» C. Magnetic constant | |
| 4. |
WHICH_OF_THE_FOLLOWING_IS_COMMONLY_VARIED_IN_MAGNETIC_DEFLECTION_MASS_SPECTROMETER??$ |
| A. | Electric sector |
| B. | Magnetic fold strength |
| C. | Magnetic constant |
| D. | Electric constant |
| Answer» C. Magnetic constant | |
| 5. |
An accuracy of 1 part in 102 has been obtained in precision mass measurements.$ |
| A. | True |
| B. | False |
| Answer» C. | |
| 6. |
Nier-Johnson_geometry_involves_a_deflection_of_which_of_the_following_radians_in_a_radial$ |
| A. | |
| B. | Π |
| C. | Π/2 |
| Answer» C. ‚âà√≠‚Äö√тĆ/2 | |
| 7. |
Which of the following components need to be added in order to increase the resolution? |
| A. | Ion source |
| B. | Detector |
| C. | Magnetic sector |
| D. | Electric sector |
| Answer» E. | |
| 8. |
The electric sector field is not subject to hysteresis. |
| A. | True |
| B. | False |
| Answer» B. False | |
| 9. |
Which of the following leads to the limitation of resolution? |
| A. | All ions do not have same energy |
| B. | All ions do not have same charge |
| C. | All ions are not of the same size |
| D. | All ions do not have the same charge |
| Answer» B. All ions do not have same charge | |
| 10. |
Mattauch-Herzog geometry involves a deflection of which of the following radians in a radial electrostatic field analyser? |
| A. | √2Π |
| B. | Π/2 |
| C. | Π/3√4 |
| D. | Π/4√2 |
| Answer» E. | |
| 11. |
Which of the following separate the ions according to their mass-to-charge? |
| A. | Ion source |
| B. | Detector |
| C. | Magnetic sector |
| D. | Electric sector |
| Answer» D. Electric sector | |
| 12. |
Direct focussing is obtained by deflecting the ion beam along a _________ trajectory through the magnetic field. |
| A. | 120<sup>o</sup> |
| B. | 150<sup>o</sup> |
| C. | 190<sup>o</sup> |
| D. | 180<sup>o</sup> |
| Answer» E. | |
| 13. |
In magnetic deflection mass spectrometer, in which of the following ways is acceleration applied to the direction of motion? |
| A. | In random manner |
| B. | Parallel to it |
| C. | Perpendicular to it |
| D. | Along it |
| Answer» D. Along it | |
| 14. |
Which of the following produces the electron beam in magnetic deflection mass spectrometer? |
| A. | Tungsten filament |
| B. | Quartz rod |
| C. | Silica |
| D. | Rhodium filament |
| Answer» B. Quartz rod | |