MCQOPTIONS
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MCQOPTIONS
This section includes 6 Mcqs, each offering curated multiple-choice questions to sharpen your Vlsi knowledge and support exam preparation. Choose a topic below to get started.
| 1. |
Oxide breakdown occurs due to |
| A. | electrostatic charge |
| B. | threshold voltage |
| C. | voltage shift |
| D. | poor input/output pad circuitry |
| Answer» E. | |
| 2. |
Hot carrier injection causes |
| A. | threshold voltage shift |
| B. | transconductance degradation |
| C. | threshold voltage shift & transconductance degradation |
| D. | none of the mentioned |
| Answer» D. none of the mentioned | |
| 3. |
_____ of faults are easier to detect. |
| A. | 50% |
| B. | 60% |
| C. | 70% |
| D. | 80% |
| Answer» E. | |
| 4. |
Test pattern generation is assisted using |
| A. | automatic test pattern generator |
| B. | exhaustive pattern generator |
| C. | repeated pattern generator |
| D. | loop pattern generator |
| Answer» B. exhaustive pattern generator | |
| 5. |
______ of the area is dedicated for testability. |
| A. | 20% |
| B. | 10% |
| C. | 30% |
| D. | 25% |
| Answer» D. 25% | |
| 6. |
Circuit nodes cannot be probed for monitoring or excitation. |
| A. | true |
| B. | false |
| Answer» B. false | |