Explore topic-wise MCQs in Vlsi.

This section includes 12 Mcqs, each offering curated multiple-choice questions to sharpen your Vlsi knowledge and support exam preparation. Choose a topic below to get started.

1.

In scan/set method __________ is used to implement a scan path.

A. serial registers
B. storage elements
C. parallel registers
D. separate register
Answer» E.
Discussion
2.

The partial scan approach scan

A. all input node faults
B. all output node faults
C. faults not detected by designer functional vector
D. all faults
Answer» D. all faults
Discussion
3.

Which occupies a lesser area?

A. lssd
B. boundary scan test
C. serial scan
D. partial scan
Answer» E.
Discussion
4.

The disadvantage of boundary scan method is that the fault coverage is less.

A. true
B. false
Answer» C.
Discussion
5.

Boundary scan method takes lesser time on test pattern generation.

A. true
B. false
Answer» B. false
Discussion
6.

The boundary scan path tests the

A. input nodes
B. output nodes
C. buffer nodes
D. interconnection points
Answer» E.
Discussion
7.

The boundary scan path is provided with

A. serial input pads
B. parallel input pads
C. parallel output pads
D. buffer pads
Answer» B. parallel input pads
Discussion
8.

Boundary scan test is used to test

A. pins
B. multipliers
C. boards
D. wires
Answer» D. wires
Discussion
9.

Which is not the function of LSSD method?

A. eliminates hazards
B. eliminates races
C. simplifies fault generation
D. stores the data
Answer» E.
Discussion
10.

The circuit operation is independent of

A. rise time
B. fall time
C. propagation delays
D. all of the mentioned
Answer» E.
Discussion
11.

Which is used to control the scan path movement?

A. clock signals
B. input signals
C. output signals
D. delay signals
Answer» B. input signals
Discussion
12.

The serial shift register is driven using

A. one over-lapping clock
B. two over-lapping clock
C. one non over-lapping clock
D. two non over-lapping clock
Answer» E.
Discussion