MCQOPTIONS
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MCQOPTIONS
This section includes 13 Mcqs, each offering curated multiple-choice questions to sharpen your Vlsi knowledge and support exam preparation. Choose a topic below to get started.
| 1. |
Which method has high over head cost? |
| A. | lssd |
| B. | partial scan |
| C. | scan/set |
| D. | random access scan |
| Answer» D. random access scan | |
| 2. |
Scan/set method has no interruption to normal operation. |
| A. | true |
| B. | false |
| Answer» B. false | |
| 3. |
Which has more number of I/O pins? |
| A. | lssd |
| B. | partial scan |
| C. | scan/set |
| D. | random access scan |
| Answer» E. | |
| 4. |
In test mode, storage elements are connected as |
| A. | parallel shift registers |
| B. | serial shift register |
| C. | combiners |
| D. | buffers |
| Answer» C. combiners | |
| 5. |
In level sensitive aspect, when an input change occurs, the response in |
| A. | dependent of components |
| B. | dependent on wiring delays |
| C. | independent of wiring delays |
| D. | independent of input combinations |
| Answer» D. independent of input combinations | |
| 6. |
The scan path shift register is verified by |
| A. | shifting in all zeroes first |
| B. | shifting in all ones first |
| C. | adding all ones |
| D. | adding all zeroes |
| Answer» C. adding all ones | |
| 7. |
The efficiency of the test pattern generation is improved by |
| A. | adding buffers |
| B. | adding multipliers |
| C. | partitioning |
| D. | adding power dividers |
| Answer» D. adding power dividers | |
| 8. |
The sequential circuit operates in _____ mode/modes of operation. |
| A. | only one |
| B. | two |
| C. | three |
| D. | four |
| Answer» C. three | |
| 9. |
Storage elements used are |
| A. | D flipflops |
| B. | JK flipflops |
| C. | RS flipflops |
| D. | All of the mentioned |
| Answer» E. | |
| 10. |
Storage elements in scan design technique is reconfigured to form |
| A. | RAM |
| B. | shift registers |
| C. | buffers |
| D. | amplifiers |
| Answer» C. buffers | |
| 11. |
A sequential circuit contains combinational logic and storage elements in |
| A. | feedback path |
| B. | output node |
| C. | input node |
| D. | non feedback path |
| Answer» B. output node | |
| 12. |
The design technique helps in improving |
| A. | controllability |
| B. | observability |
| C. | controllability and observability |
| D. | overall performance |
| Answer» D. overall performance | |
| 13. |
The major difficulty in sequential circuit testing is in |
| A. | determining output |
| B. | determining internal state |
| C. | determining external state |
| D. | determining input combinations |
| Answer» C. determining external state | |