Explore topic-wise MCQs in Vlsi.

This section includes 10 Mcqs, each offering curated multiple-choice questions to sharpen your Vlsi knowledge and support exam preparation. Choose a topic below to get started.

1.

Which method has more area overhead?

A. random test pattern
B. pseudo random test pattern
C. algorithmic test pattern
D. deterministic test pattern
Answer» C. algorithmic test pattern
Discussion
2.

AND gate is used to ensure whether the test patterns have sufficient clock cycles.

A. true
B. false
Answer» C.
Discussion
3.

The sequential depth is the number of

A. OR gates
B. AND gates
C. flip flops
D. EX-OR gates
Answer» D. EX-OR gates
Discussion
4.

Reset signal weight is given as

A. 2m
B. 2(-m)
C. 2m
D. 2(-m)
Answer» C. 2m
Discussion
5.

Initialization of the test pattern generator to all 1’s generate

A. global reset
B. clear
C. toggle
D. buffer
Answer» B. clear
Discussion
6.

The probability of given bit in LFSR being logic 0 is

A. 0
B. 1
C. 0.25
D. 0.5
Answer» E.
Discussion
7.

Circuits with global reset have fault coverage in the range of

A. 5% to 10%
B. 11% to 15%
C. 15% to 20%
D. 6% to 8%
Answer» C. 15% to 20%
Discussion
8.

The circuit which incorporates _______ can be tested with weighted pseudo-random test pattern.

A. preset
B. reset
C. clear
D. break
Answer» B. reset
Discussion
9.

Large AND function will produce _______ infrequently.

A. logic 0
B. logic 0 and logic 1
C. logic 1
D. neither logic 0 or 1
Answer» D. neither logic 0 or 1
Discussion
10.

Which exhibits low fault coverage?

A. random test pattern
B. pseudo random test pattern
C. deterministic test pattern
D. algorithmic test pattern
Answer» C. deterministic test pattern
Discussion