MCQOPTIONS
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MCQOPTIONS
This section includes 13 Mcqs, each offering curated multiple-choice questions to sharpen your Vlsi knowledge and support exam preparation. Choose a topic below to get started.
| 1. |
Which method is used for external functional testing? |
| A. | exhaustive test pattern method |
| B. | pseudo-exhaustive test pattern method |
| C. | random test pattern method |
| D. | pseudo-random test pattern method |
| Answer» D. pseudo-random test pattern method | |
| 2. |
A n-bit counter produces ______ number of total input combinations. |
| A. | 2(n-1) |
| B. | 2(n+1) |
| C. | 2n |
| D. | 2n |
| Answer» D. 2n | |
| 3. |
Which is known as the stored test pattern method? |
| A. | deterministic test pattern |
| B. | algorithmic test pattern |
| C. | random test pattern |
| D. | exhaustive test pattern |
| Answer» B. algorithmic test pattern | |
| 4. |
WHICH_METHOD_IS_USED_FOR_EXTERNAL_FUNCTIONAL_TESTING??$ |
| A. | exhaustive test pattern method |
| B. | pseudo-exhaustive test pattern method |
| C. | random test pattern method |
| D. | pseudo-random test pattern method |
| Answer» D. pseudo-random test pattern method | |
| 5. |
In which method sequences are repeatable? |
| A. | exhaustive test pattern method |
| B. | pseudo-exhaustive test pattern method |
| C. | random test pattern method |
| D. | pseudo-random test pattern method |
| Answer» E. | |
| 6. |
Which method needs fault simulation? |
| A. | exhaustive test pattern method |
| B. | pseudo-exhaustive test pattern method |
| C. | random test pattern method |
| D. | deterministic test pattern method |
| Answer» B. pseudo-exhaustive test pattern method | |
| 7. |
Which is not suitable for circuits having large N values? |
| A. | exhaustive test pattern method |
| B. | pseudo-exhaustive test pattern method |
| C. | random test pattern method |
| D. | deterministic test pattern method |
| Answer» B. pseudo-exhaustive test pattern method | |
| 8. |
Exhaustive test pattern also detects delay faults. |
| A. | true |
| B. | false |
| Answer» C. | |
| 9. |
Exhaustive test pattern determines |
| A. | gate level faults |
| B. | logic level faults |
| C. | functional faults |
| D. | structural faults |
| Answer» B. logic level faults | |
| 10. |
A n-bit counter produces ______ number of total input combinations |
| A. | 2<sup>(n-1)</sup> |
| B. | 2<sup>(n+1)</sup> |
| C. | 2<sup>n </sup> |
| D. | 2n |
| Answer» D. 2n | |
| 11. |
Which method uses finite state machine for developing the test pattern? |
| A. | deterministic test pattern |
| B. | algorithmic test pattern |
| C. | random test pattern |
| D. | exhaustive test pattern |
| Answer» C. random test pattern | |
| 12. |
Which is known as stored test pattern method? |
| A. | deterministic test pattern |
| B. | algorithmic test pattern |
| C. | random test pattern |
| D. | exhaustive test pattern |
| Answer» B. algorithmic test pattern | |
| 13. |
Which method is used to determine structural defects? |
| A. | deterministic test pattern |
| B. | algorithmic test pattern |
| C. | random test pattern |
| D. | exhaustive test pattern |
| Answer» B. algorithmic test pattern | |